About Us
Company Profile
Corporate Culture
Development History
Patent Certificate
Qualification and Honor
Products
UV Components
DI Lithography/ Maskless Lithography
Parallel Light/Proximity (Contact) Lithography
Telematics Applications
Virtual Display/Myopia Prevention
Airborne Imaging Without Any Medium
Other Optics
Technology
Design Capacity
Manufacture
Test Equipment
News
Join Us
Talent Culture
Brilliant BHOE
Recruitment Positions
Contact Us
Message
Contact
中文
|
EN
About Us
Company Profile
Corporate Culture
Development History
Patent Certificate
Qualification and Honor
Products
UV Components
DI Lithography/ Maskless Lithography
Parallel Light/Proximity (Contact) Lithography
Telematics Applications
Virtual Display/Myopia Prevention
Airborne Imaging Without Any Medium
Other Optics
Technology
News
Join Us
Talent Culture
Brilliant BHOE
Recruitment Positions
Contact Us
Message
Contact
中文
English
Home
>
Products
>
DI Lithography/ Maskless Lithography
>
1.3X-2.7X 405nm DI Lithography System
1.3X-2.7X 405nm DI Lithography System
1.3X-2.7X 405nm DI Lithography System
Trace Photolithography
Trace Photolithography
Specifications
Key Technical Indicators
Specifications
Magnification
1.3X-2.7X
waves
405nm
Line Width Resolution
15-50um
Application Fields
Applied to PCB Trace Layer Exposure Photolithography Process, with Excellent Depth of Focus
Product Consultation
Submit
Copyright © BHOE All Rights Reserved.
开云线上平台(集团)官方网站
|
开云官方在线入口
|
九州线上平台
|
心博网页版页面登录
|
开云kaiyun官方网页版
|
D体育网页版_D体育(中国)
|
OD在线平台
|
九州网页版登录入口
|
U8国际
|